Latest news:

IWCT program is now online

more details ...

Submission deadline extended

Official: the workshop has been accepted for ICST. See you in Xian!

Web site for the proposal is up and running

Program Chairs

Organizing Committee

Steering Committee



IWCT 2019 – Program

Note: Full and short papers are allocated 30 and 20 mins for presentation, respectively (including 5 mins Q&A).

Opening Session

(Duration: 08.50 - 9.00)

  1. Opening Remarks: Welcome to IWCT [slides] (10 mins)
    Dimitris E. Simos and Jeff Lei

Full Paper Session 1: Modelling and Tools

(Duration: 09.00 - 10.00)

  1. A Framework for Automated Combinatorial Test Generation
    Joshua Bonn, Konrad Fögen and Horst Lichter
  2. On the Industrial Application of Combinatorial Testing for Autonomous Driving Functions
    Jianbo Tao, Yihao Li, Franz Wotawa, Hermann Felbinger and Mihai Nica

Coffee break: 10.00 - 10.30

Full Paper Session 2: Test Generation, Constraints and Fault Localization

(Duration: 10.30 - 12.30)

  1. An Approach to T-way Test Sequence Generation With Constraints
    Feng Duan, Yu Lei, Raghu Kacker and Rick Kuhn
  2. Efficient and Guaranteed Detection of t-way Failure-inducing Combinations
    Paolo Arcaini, Angelo Gargantini and Marco Radavelli
  3. Using Parameter Mapping to Avoid Forbidden Tuples in a Covering Array
    Chang Rao, Nan Li, Yu Lei, Raghu Kacker, Richard Kuhn and Jin Guo
  4. Partitioned Search with Column Resampling for Locating Array Construction
    Erin Lanus, Charles Colbourn and Douglas Montgomery

Lunch: 12.30 - 13.30

Short Paper Session 1: Measurement and Test Reduction

(Duration: 13.30 - 14.30)

  1. Measuring Combinatorial Coverage at Adobe
    Riley Smith, Darryl Jarman, Richard Kuhn, Raghu Kacker, Dimitris Simos and Jared Bellows
  2. On Measuring Combinatorial Coverage of Manually Created Test Cases for Industrial Software
    Miraldi Fifo, Eduard Paul Enoiu and Wasif Afzal
  3. Reduce Test Cost by Reusing Test Oracles through Combinatorial Join
    Hiroshi Ukai, Xiao Qu, Hironori Washizaki and Yoshiaki Fukazawa

Short Paper Session 2: Practical Applications

(Duration: 14.30 - 15.30)

  1. Applying Combinatorial Testing to Large-scale Data Processing at Adobe
    Riley Smith, Darryl Jarman, Richard Kuhn, Raghu Kacker, Dimitris Simos, Ludwig Kampel, Manuel Leithner and Gabe Gosney
  2. Practical Fault Localization with Combinatorial Test Design
    Dale Blue, Andrew Hicks, Rachel Tzoref-Brill and Ryan Rawlins
  3. An Industrial Study on Applications of Combinatorial Testing in Modern Web Development and Cloud Computing
    Murat Ozcan

Coffee break: 15.30 - 16.00

Poster Session

(Duration: 15.30 - 16.30, starting on coffee break)

  1. Crucial Tool Features for Successful Combinatorial Input Parameter Testing in an Industrial Application
    Christian Eitner and Franz Wotawa
  2. Scenario Sampling for Cyber Physical Systems using Combinatorial Testing
    Akihisa Yamada, Clovis Eberhart, Fuyuki Ishikawa and Nian-Ze Lee

IWCT Organizing & Steering Committee Meeting

(Duration: 16.30 - 17.30)

Note: It is strongly advised to take care of your VISA arrangements to Xian as soon as possible. For further information, please consult the main ICST website here