IWCT 2019 – Program
Note: Full and short papers are allocated 30 and 20 mins for presentation, respectively (including 5 mins Q&A).
Opening Session
(Duration: 08.50 - 9.00)
- Opening Remarks: Welcome to IWCT [slides] (10 mins)
Dimitris E. Simos and Jeff Lei
Full Paper Session 1: Modelling and Tools
(Duration: 09.00 - 10.00)
- A Framework for Automated Combinatorial Test Generation
Joshua Bonn, Konrad Fögen and Horst Lichter
- On the Industrial Application of Combinatorial Testing for Autonomous Driving Functions
Jianbo Tao, Yihao Li, Franz Wotawa, Hermann Felbinger and Mihai Nica
Coffee break: 10.00 - 10.30
Full Paper Session 2: Test Generation, Constraints and Fault Localization
(Duration: 10.30 - 12.30)
- An Approach to T-way Test Sequence Generation With Constraints
Feng Duan, Yu Lei, Raghu Kacker and Rick Kuhn
- Efficient and Guaranteed Detection of t-way Failure-inducing Combinations
Paolo Arcaini, Angelo Gargantini and Marco Radavelli
- Using Parameter Mapping to Avoid Forbidden Tuples in a Covering Array
Chang Rao, Nan Li, Yu Lei, Raghu Kacker, Richard Kuhn and Jin Guo
- Partitioned Search with Column Resampling for Locating Array Construction
Erin Lanus, Charles Colbourn and Douglas Montgomery
Lunch: 12.30 - 13.30
Short Paper Session 1: Measurement and Test Reduction
(Duration: 13.30 - 14.30)
- Measuring Combinatorial Coverage at Adobe
Riley Smith, Darryl Jarman, Richard Kuhn, Raghu Kacker, Dimitris Simos and Jared Bellows
- On Measuring Combinatorial Coverage of Manually Created Test Cases for Industrial Software
Miraldi Fifo, Eduard Paul Enoiu and Wasif Afzal
- Reduce Test Cost by Reusing Test Oracles through Combinatorial Join
Hiroshi Ukai, Xiao Qu, Hironori Washizaki and Yoshiaki Fukazawa
Short Paper Session 2: Practical Applications
(Duration: 14.30 - 15.30)
- Applying Combinatorial Testing to Large-scale Data Processing at Adobe
Riley Smith, Darryl Jarman, Richard Kuhn, Raghu Kacker, Dimitris Simos, Ludwig Kampel, Manuel Leithner and Gabe Gosney
- Practical Fault Localization with Combinatorial Test Design
Dale Blue, Andrew Hicks, Rachel Tzoref-Brill and Ryan Rawlins
- An Industrial Study on Applications of Combinatorial Testing in Modern Web Development and Cloud Computing
Murat Ozcan
Coffee break: 15.30 - 16.00
Poster Session
(Duration: 15.30 - 16.30, starting on coffee break)
- Crucial Tool Features for Successful Combinatorial Input Parameter Testing in an Industrial Application
Christian Eitner and Franz Wotawa
- Scenario Sampling for Cyber Physical Systems using Combinatorial Testing
Akihisa Yamada, Clovis Eberhart, Fuyuki Ishikawa and Nian-Ze Lee
IWCT Organizing & Steering Committee Meeting
(Duration: 16.30 - 17.30)
Note: It is strongly advised to take care of your VISA arrangements to Xian as soon as possible. For further information, please consult the main ICST website here